Since its inception in 1986, the field of atomic force microscopy (AFM) has enabled surface analysis and characterisation with unparalleled resolution in a wide variety of environments. However, the technique is limited by very low sample throughput and temporal resolution making it impractical for materials science research on macro sized or time evolving samples such as the observation of corrosion. The potential of AFM sparked intense efforts to overcome these limitations shortly after its invention, and has led to the development of high-speed atomic force microscopes (HS-AFMs). Within the last 5 years the technology underpinning these instruments has matured to the point where routine imaging can achieve megapixels per second over scan areas of square millimetres, removing the limitations from AFM for industrial scale materials characterisation. This review explains the technology and looks to the future use of HS-AFMs in materials science.
MoritaS.: ‘Atom world based on nano-forces: 25 years of atomic force microscopy’, Microscopy, 2011, 60, (Suppl No. 1), S199–S211. doi: 10.1093/jmicro/dfr047
DelvalléeA.FeltinN.DucourtieuxS.TrabelsiM.HochepiedJ. F.: ‘Direct comparison of AFM and SEM measurements on the same set of nanoparticles’, Meas. Sci. Technol., 2015, 26, (8), 085601. doi: 10.1088/0957-0233/26/8/085601
6.
GrabarK. C.BrownK. R.KeatingC. D.StranickS. J.TangS. L.NatanM. J.: ‘Nanoscale characterization of gold colloid monolayers: a comparison of four techniques’, Anal. Chem., 1997, 69, (3), 471–477. doi: 10.1021/ac9605962
7.
CastleJ. E.ZhdanP. A.: ‘Characterization of surface topography by SEM and SFM: problems and solutions’, J. Phys. D. Appl. Phys., 1997, 30, (5), 722–740. doi: 10.1088/0022-3727/30/5/004
GrossL.MohnF.MollN.LiljerothP.MeyerG.: ‘The chemical structure of a molecule resolved by atomic force microscopy’, Science, 2009, 325, (5944), 1110–1114. doi: 10.1126/science.1176210
14.
RanaM. S.PotaH. R.PetersenI. R.: ‘Spiral scanning with improved control for faster imaging of AFM’, IEEE Trans. Nanotechnol.,2014, 13, (3), 541–550.
15.
MahmoodI. A.MoheimaniS. O. R.: ‘Spiral scanning: An alternative to conventional raster scanning in high-speed scanning probe microscopes’, Am. Control Conf., 2010, 2010, 5757–5762.
16.
TumaT.LygerosJ.KartikV.SebastianA.PantaziA.: ‘High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories’, Nanotechnology, 2012, 23, (18), 185501–185509. doi: 10.1088/0957-4484/23/18/185501
BazaeiA.YongY. K.MoheimaniS. O. R.: ‘High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues’, Rev. Sci. Instrum., 2012, 83, (6), 063701–063710. doi: 10.1063/1.4725525
19.
MeyerG.AmerN. M.: ‘Novel optical approach to atomic force microscopy’, Appl. Phys. Lett., 1988, 53, (12), 1045–1047. doi: 10.1063/1.100061
ZhongQ.InnissD.KjollerK.ElingsV. B.: ‘Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy’, Surf. Sci. Lett., 1993, 290, (1–2), L688–L692.
22.
GiessiblF. J.: ‘Atomic resolution on Si (111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork’, Appl. Phys. Lett., 2000, 76, (11), 1470–1472. doi: 10.1063/1.126067
TambeN. S.BhushanB.: ‘A new atomic force microscopy based technique for studying nanoscale friction at high sliding velocities’, J. Phys. D. Appl. Phys., 2005, 38, (5), 764–773. doi: 10.1088/0022-3727/38/5/015
25.
TambeN. S.BhushanB.: ‘Scale dependence of micro/nano-friction and adhesion of MEMS/NEMS materials, coatings and lubricants’, Nanotechnology, 2004, 15, (11), 1561–1570. doi: 10.1088/0957-4484/15/11/033
26.
WeiZ.WangC.BaiC.: ‘Investigation of nanoscale frictional contact by friction force microscopy’, Langmuir, 2001, 17, (13), 3945–3951. doi: 10.1021/la001185q
27.
PaigeM. F.: ‘A comparison of atomic force microscope friction and phase imaging for the characterization of an immiscible polystyrene / poly (methyl methacrylate) blend film’, 2003, 44, 6345–6352.
28.
Moreno-HerreroF.ColcheroJ.Gómez-HerreroJ.BaróA. M.: ‘Atomic force microscopy contact, tapping, and jumping modes for imaging biological samples in liquids’, Phys. Rev. E, 2004, 69, (3), 031915–031919. doi: 10.1103/PhysRevE.69.031915
GrossL.MohnF.LiljerothP.ReppJ.GiessiblF. J.MeyerG.: ‘Measuring the charge state of an adatom with noncontact atomic force microscopy’, Science, 2009, 324, (5933), 1428–1431. doi: 10.1126/science.1172273
31.
CouturierG.NonyL.BoisgardR.AiméJ. P.: ‘Stability analysis of an oscillating tip-cantilever system in NC-AFM’, Appl. Surf. Sci., 2002, 188, (3–4), 341–348. doi: 10.1016/S0169-4332(01)00948-5
32.
WelkerJ.GiessiblF. J.: ‘Revealing the angular symmetry of chemical bonds by atomic force microscopy’, Science, 2012, 336, (6080), 444–449. doi: 10.1126/science.1219850
33.
EmmrichM.HuberF.PielmeierF.WelkerJ.HofmannT.SchneiderbauerM.MeuerD.PolesyaS.MankovskyS.KodderitzschD.EbertH.GiessiblF. J.: ‘Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters’, Science, 2015, 348, (6232), 308–311. doi: 10.1126/science.aaa5329
34.
AlbrechtT. R.AkamineS.: ‘Microfabrication of cantilever styli for the atomic force microscope’, J. Vac. Sci. Technol. A, 1990, 8, (4), 3386–3396. doi: 10.1116/1.576520
35.
RangelowI. W.ShiF.HudekP.GotszalkT.GrabiecP. B.DumaniaP.: ‘Fabrication of piezoresistive-sensed AFM cantilever probe with integrated tip’ in ‘Micromachining and microfabrication ‘96’, (ed. PangS. W.ChangS.-C.), 56–64; 1996, Bellingham, Washington, International Society for Optics and Photonics. doi:10.1117/12.251232
36.
TaatjesD. J.QuinnA. S.LewisM. R.BovillE. G.: ‘Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images’, Microsc. Res. Technol., 1999, 44, (5), 312–326. doi: 10.1002/(SICI)1097-0029(19990301)44:5<312::AID-JEMT2>3.0.CO;2-P
37.
FrancisL. W.LewisP. D.WrightC. J.ConlanR. S.: ‘Atomic force microscopy comes of age’, Biol. Cell, 2010, 102, (2), 133–143.
38.
LiuS.WangY.: ‘A review of the application of atomic force microscopy (AFM) in food science and technology’, Adv. Food Nutr. Res., 2011, 62, 201–240. doi: 10.1016/B978-0-12-385989-1.00006-5
39.
WallaceJ. M.: ‘Applications of atomic force microscopy for the assessment of nanoscale morphological and mechanical properties of bone’, Bone, 2012, 50, (1), 420–427. doi: 10.1016/j.bone.2011.11.008
40.
GarciaR.HerruzoE. T.: ‘The emergence of multifrequency force microscopy’, Nat. Nanotechnol., 2012, 7, (4), 217–226. doi: 10.1038/nnano.2012.38
41.
ChyasnavichyusM.YoungS. L.TsukrukV. V.: ‘Recent advances in micromechanical characterization of polymer, biomaterial, and cell surfaces with atomic force microscopy’, Jpn. J. Appl. Phys., 2015, 54, (8S2), 08LA02–08LA13. doi: 10.7567/JJAP.54.08LA02
42.
HosakaS.EtohK.KikukawaA.KoyanagiH.: ‘Megahertz silicon atomic force microscopy (AFM) cantilever and high-speed readout in AFM-based recording’, J. Vac. Sci. Technol. B Microelectron. Nanom. Struct., 2000, 18, (1), 94. doi: 10.1116/1.591157
43.
PalocziG. T.SmithB. L.HansmaP. K.WaltersD. A.WendmanM. A.: ‘Rapid imaging of calcite crystal growth using atomic force microscopy with small cantilevers’, Appl. Phys. Lett., 1998, 73, (12), 1658–1660. doi: 10.1063/1.122237
44.
AndoT.: ‘High-speed atomic force microscopy coming of age’, Nanotechnology, 2012, 23, (6), 062001–062027. doi: 10.1088/0957-4484/23/6/062001
45.
BraunsmannC.SchäfferT. E.: ‘High-speed atomic force microscopy for large scan sizes using small cantilevers’, Nanotechnology, 2010, 21, (22), 225705–225707. doi: 10.1088/0957-4484/21/22/225705
46.
FukumaT.JarvisS. P.: ‘Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions’, Rev. Sci. Instrum., 2006, 77, (4), 043701–043708. doi: 10.1063/1.2188867
47.
LabudaA.BrastaviceanuT.PavlovI.PaulW.RassierD. E.: ‘Optical detection system for probing cantilever deflections parallel to a sample surface’, Rev. Sci. Instrum., 2011, 82, (1), 59–62.
PaytonO. D.PiccoL.MilesM. J.HomerM. E.ChampneysA. R.: ‘Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy’, Rev. Sci. Instrum., 2012, 83, (8), 083710. doi: 10.1063/1.4747455
50.
RasoolH. I.WilkinsonP. R.StiegA. Z.GimzewskiJ. K.: ‘A low noise all-fiber interferometer for high resolution frequency modulated atomic force microscopy imaging in liquids’, Rev. Sci. Instrum., 2010, 81, (2), 023703–023710. doi: 10.1063/1.3297901
51.
LeungC.BestembayevaA.ThorogateR.StinsonJ.PyneA.MarcovichC.YangJ.DrechslerU.DespontM.JankowskiT.TschöpeM.HoogenboomB. W.: ‘Atomic force microscopy with nanoscale cantilevers resolves different structural conformations of the DNA double helix’, Nano Lett., 2012, 12, (7), 3846–3850. doi: 10.1021/nl301857p
SpletzerM.RamanA.ReifenbergerR.: ‘Spatio-temporal dynamics of microcantilevers tapping on samples observed under an atomic force microscope integrated with a scanning laser Doppler vibrometer: applications to proper orthogonal decomposition and model reduction’, J. Micromech. Microeng., 2010, 20, (8), 085024. doi: 10.1088/0960-1317/20/8/085024
56.
LiaoH.-S.HuangK.-Y.HwangI.-S.ChangT.-J.HsiaoW. W.LinH.-H.HwuE.-T.ChangC.-S.: ‘Operation of astigmatic-detection atomic force microscopy in liquid environments’, Rev. Sci. Instrum., 2013, 84, (10), 103709–1037097. doi: 10.1063/1.4826494
57.
LiaoH.-S.ChenY.-H.DingR.-F.HuangH.-F.WangW.-M.HwuE.-T.HuangK.-Y.ChangC.-S.HwangI.-S.: ‘High-speed atomic force microscope based on an astigmatic detection system’, Rev. Sci. Instrum., 2014, 85, (10), 103710–103717. doi: 10.1063/1.4898019
58.
HwuE.-T.IllersH.JuskoL.DanzebrinkH.-U.: ‘A hybrid scanning probe microscope (SPM) module based on a DVD optical head’, Meas. Sci. Technol., 2009, 20, (8), 084005–084008. doi: 10.1088/0957-0233/20/8/084005
59.
LeeS. H.: ‘High precision deflection measurement of microcantilever in an optical pickup head based atomic force microscopy’, Rev. Sci. Instrum., 2012, 83, (11), 113703–113704. doi: 10.1063/1.4768459
FantnerG. E.SchumannW.BarberoR. J.DeutschingerA.TodorovV.GrayD. S.BelcherA M.RangelowI. W.Youcef-ToumiK.: ‘Use of self-actuating and self-sensing cantilevers for imaging biological samples in fluid’, Nanotechnology, 2009, 20, (43), 434003–434010. doi: 10.1088/0957-4484/20/43/434003
62.
Soltani BozchalooiI.Youcef-ToumiK.: ‘Multi-actuation and PI control: a simple recipe for high-speed and large-range atomic force microscopy’, Ultramicroscopy, 2014, 146, 117–124. doi: 10.1016/j.ultramic.2014.07.010
63.
SchitterG.StarkR. W.StemmerA.: ‘Fast contact-mode atomic force microscopy on biological specimen by model-based control’, Ultramicroscopy, 2004, 100, (3), 253–257. doi: 10.1016/j.ultramic.2003.11.008
64.
SchitterG.AllgöwerF.StemmerA.: ‘A new control strategy for high-speed atomic force miciroscopy’, Nanotechnology, 2004, 15, (1), 108–114. doi: 10.1088/0957-4484/15/1/021
65.
PaytonO.ChampneysA. R.HomerM. E.PiccoL.MilesM. J.: ‘Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment’, Proc. R. Soc. A: Math. Phys. Eng. Sci., 2011, 467, (2130), 1801–1822.
66.
KoderaN.SakashitaM.AndoT.: ‘Dynamic proportional-integral-differential controller for high-speed atomic force microscopy’, Rev. Sci. Instrum., 2006, 77, 083704–083707. doi: 10.1063/1.2336113
67.
PiccoL.BozecL.UlcinasA.EngledewD. J.AntognozziM.HortonM.MilesM. J.: ‘Breaking the speed limit with atomic force microscopy’, Nanotechnology, 2007, 18, (4), 044030–044033. doi: 10.1088/0957-4484/18/4/044030
AdamsJ. D.NievergeltA.EricksonB. W.YangC.DukicM.FantnerG. E.: ‘High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers’, Rev. Sci. Instrum., 2014, 85, 093702–093707. doi: 10.1063/1.4895460
72.
NoiK.YamamotoD.NishikoriS.Arita-MoriokaK. I.KatoT.AndoT.OguraT.: ‘High-speed atomic force microscopic observation of ATP-dependent rotation of the AAA+ chaperone p97’, Structure, 2013, 21, (11), 1992–2002. doi: 10.1016/j.str.2013.08.017
73.
SuzukiY.SakaiN.YoshidaA.UekusaY.YagiA.ImaokaY.ItoS.KarakiK.TakeyasuK.: ‘High-speed atomic force microscopy combined with inverted optical microscopy for studying cellular events’, Sci. Rep., 2013, 3, 2131–2137.
74.
YongY. K.MoheimaniS. O. R.KentonB. J.LeangK. K.: ‘Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues’, Rev. Sci. Instrum., 2012, 83, (12), 121101–121122. doi: 10.1063/1.4765048
75.
WadikhayeS. P.YongY. K.MoheimaniS. O. R.: ‘Design of a compact serial-kinematic scanner for high-speed atomic force microscopy: an analytical approach’, Micro Nano Lett., 2012, 7, (4), 309–313. doi: 10.1049/mnl.2011.0477
76.
ZurichE. T. H.: ‘The four pillars of nanopositioning for scanning probe microscopy’, ETH Zurich 2013.
ChenY.CaiJ.LiuM.ZengG.FengQ.ChenZ.: ‘Research on double-probe, double- and triple-tip effects during atomic force microscopy scanning’, Scanning, 2004, 26, (4), 155–161. doi: 10.1002/sca.4950260402
80.
KillgoreJ. P.GeissR. H.HurleyD. C.: ‘Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy’, Small, 2011, 7, (8), 1018–1022. doi: 10.1002/smll.201002116
81.
BarrettR. C.: ‘High-speed, large-scale imaging with the atomic force microscope’, J. Vac. Sci. Technol. B: Microelectron. Nanom. Struct., 1991, 9, (2), 302–306. doi: 10.1116/1.585610
KuwajimaS.HorieS.HoriuchiT.YamadaH.MatsushigeK.IshidaK.: ‘Crystal and layer structures of ferroelectric oligomer thin films’, Macromolecules, 2009, 42, (9), 3353–3357. doi: 10.1021/ma802639r
85.
AdamskaA. M.SpringellR.WarrenA. D.PiccoL.PaytonO.ScottT. B.: ‘Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications’, J. Phys. D.: Appl. Phys., 2014, 47, (31), 315301–315310. doi: 10.1088/0022-3727/47/31/315301
86.
McPhersonA.MalkinA. J.KuznetsovY. G.: ‘Atomic force microscopy in the study of macromolecular crystal growth’, Annu. Rev. Biophys. Biomol. Struct., 2000, 29, (1), 361–410. doi: 10.1146/annurev.biophys.29.1.361
87.
KuznetsovY. G.MalkinA. J.McPhersonA.: ‘AFM studies of the nucleation and growth mechanisms of macromolecular crystals’, J. Cryst. Growth, 1999, 196, (2–4), 489–502. doi: 10.1016/S0022-0248(98)00856-2
88.
CaoY.LiM.ChengM.SongJ.HuZ.: ‘An in situ AFM investigation on the morphology of the (100) growth interface of ZTS crystal’, J. Cryst. Growth, 2014, 388, 22–28. doi: 10.1016/j.jcrysgro.2013.07.039
89.
HillnerP. E.ManneS.GratzA. J.HansmaP. K.: ‘AFM images of dissolution and growth on a calcite crystal’, Ultramicroscopy, 1992, 42–44, 1387–1393. doi: 10.1016/0304-3991(92)90454-R
90.
AndoT.KoderaN.NaitoY.KinoshitaT.FurutaK.ToyoshimaY. Y.: ‘A high-speed atomic force microscope for studying biological macromolecules in action’, Chem. Phys. Chem., 2003, 4, (11), 1196–1202.
91.
AndoT.KoderaN.TakaiE.MaruyamaD.SaitoK.TodaA.: ‘A high-speed atomic force microscope for studying biological macromolecules’, Proc. Natl. Acad. Sci.,2001, 98, (22), 12468–12472.
92.
RostM. J.CramaL.SchakelP.Van TolE.Van Velzen-WilliamsG. B. E. M.OvergauwC. F.Ter HorstH.DekkerH.OkhuijsenB.SeynenM.VijftigschildA.HanP.KatanA. J.SchootsK.SchummR.Van LooW.OosterkampT. H.FrenkenJ. W. M.: ‘Scanning probe microscopes go video rate and beyond’, Rev. Sci. Instrum., 2005, 76, (5), 053710–053719. doi: 10.1063/1.1915288
93.
ShibataM.UchihashiT.AndoT.YasudaR.: ‘Long-tip high-speed atomic force microscopy for nanometer-scale imaging in live cells’, Sci. Rep., 2015, 5, 8724–8727. doi: 10.1038/srep08724
94.
AndoT.: ‘Molecular machines directly observed by high-speed atomic force microscopy’, FEBS Lett, 2013, 587, 997–1007. doi: 10.1016/j.febslet.2012.12.024
95.
CasusoI.KoderaN.Le GrimellecC.AndoT.ScheuringS.: ‘Contact-mode high-resolution high-speed atomic force microscopy movies of the purple membrane’, Biophys. J., 2009, 97, (5), 1354–1361. doi: 10.1016/j.bpj.2009.06.019
96.
AndoT.‘Control techniques in high-speed atomic force microscopy’, Proc. Am. Control Conf. 2008, (4586984), 3194–3200. doi:10.1109/ACC.2008
97.
KoderaN.YamashitaH.AndoT.: ‘Active damping of the scanner for high-speed atomic force microscopy’, Rev. Sci. Instrum.,2005, 76, 1–5. doi:10.1063/1.1903123
98.
AndoT.UchihashiT.KoderaN.YamamotoD.TaniguchiM.MiyagiA.YamashitaH.: ‘High-speed atomic force microscopy for observing dynamic biomolecular processes’, J. Mol. Recognit.,2007, 20, 448–458.
99.
FukudaS.UchihashiT.AndoT.: ‘Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope’, Rev. Sci. Instrum., 2015, 86, (6), 063703–063707. doi: 10.1063/1.4922381
100.
AndoT.UchihashiT.KoderaN.YamamotoD.MiyagiA.TaniguchiM.YamashitaH.: ‘High-speed AFM and nano-visualization of biomolecular processes’, Pflugers Arch. Eur. J. Physiol,2008, (456), 211–225.
101.
WatanabeH.UchihashiT.KobashiT.ShibataM.NishiyamaJ.YasudaR.AndoT.: ‘Wide-area scanner for high-speed atomic force microscopy’, Rev. Sci. Instrum., 2013, 84, (5), 053702–053710. doi: 10.1063/1.4803449
102.
KoderaN.YamamotoD.IshikawaR.AndoT.: ‘Video imaging of walking myosin V by high-speed atomic force microscopy’, Nature, 2010, 468, (7320), 72–76. doi: 10.1038/nature09450
ItaniT.: ‘A comprehensive review of EUV resist materials and processing at selete’, J. Photopolym. Sci. Technol., 2011, 24, (2), 111–118. doi: 10.2494/photopolymer.24.111
109.
PlummerL. N.WigleyT. M. L.ParkhurstD. L.: ‘The kinetics of calcite dissolution in CO2 -water systems at 5 degrees to 60 degrees C and 0.0 to 1.0 atm CO2’, Am. J. Sci., 1978, 278, (2), 179–216. doi: 10.2475/ajs.278.2.179
110.
BeckerC. R.StrawheckerK. E.McAllisterQ. P.LundgrenC. A.: ‘In situ atomic force microscopy of lithiation and delithiation of silicon nanostructures for lithium ion batteries’, ACS Nano, 2013, 7, (10), 9173–9182. doi: 10.1021/nn4037909
111.
PyneA.MarksW.PiccoL.DuntonP.UlcinasA.BarbourM.JonesS.GimzewskiJ.MilesM. J.: ‘High-speed atomic force microscopy of dental enamel dissolution in citric acid’, Arch. Histol. Cytol., 2009, 72, (4–5), 209–215. doi: 10.1679/aohc.72.209
112.
PiccoL. M.ScottT.ReedJ.PaytonO. D.: ‘Contact mode high-speed AFM – current capabilities’, Submitted to IOP Nanotechnology, press.
113.
PiccoL.DuntonP. G.UlcinasA.EngledewD. J.HoshiO.UshikiT.MilesM. J.: ‘High-speed AFM of human chromosomes in liquid’, Nanotechnology2008, 19, (38), 384018. doi: 10.1088/0957-4484/19/38/384018
SeréP. R.CulcasiJ. D.ElsnerC. I.Di SarliA. R.: ‘Relationship between texture and corrosion resistance in hot-dip galvanized steel sheets’, Surf. Coat. Technol., 1999, 122, (2–3), 143–149. doi: 10.1016/S0257-8972(99)00325-4
117.
StreetS. R.MiN.CookA. J. M. C.Mohammed-AliH. B.GuoL.RaymentT.DavenportA. J.: ‘Atmospheric pitting corrosion of 304L stainless steel: the role of highly concentrated chloride solutions’, Faraday Discuss., 2015, 180, 251–265. doi: 10.1039/C4FD00246F
118.
StreetS. R.XuW.AmriM.GuoL.GlanvillS. J. M.QuinnP. D.MosselmansJ. F. W.Vila-ComamalaJ.RauC.RaymentT.DavenportA. J.: ‘The effect of nitrate on salt layers in pitting corrosion of 304L stainless steel’, J. Electrochem. Soc., 2015, 162, (9), C457–C464. doi: 10.1149/2.0421509jes
119.
XuQ.GaoK.WangY.PangX.: ‘Characterization of corrosion products formed on different surfaces of steel exposed to simulated groundwater solution’, Appl. Surf. Sci., 2015, 345, 10–17. doi: 10.1016/j.apsusc.2015.03.143
120.
BrinkmannT.NaderipourC.PohlmannJ.WindJ.WolffT.EscheE.MüllerD.WoznyG.HotingB.: ‘Pilot scale investigations of the removal of carbon dioxide from hydrocarbon gas streams using poly (ethylene oxide)–poly (butylene terephthalate) PolyActive™) thin film composite membranes’, J. Memb. Sci., 2015, 489, 237–247. doi: 10.1016/j.memsci.2015.03.082
121.
ChenN.Reeja-JayanB.LauJ.MoniP.LiuA.DunnB.GleasonK. K.: ‘Nanoscale, conformal polysiloxane thin film electrolytes for three-dimensional battery architectures’, Mater. Horiz., 2015, 2, (3), 309–314. doi: 10.1039/C4MH00246F
122.
J. K. Hobbs, C. Vasilev and A. D. L. Humphris: ‘VideoAFM — a new tool for high speed surface analysis’, Analyst, 131, 2006, 251–256.
123.
HobbsJ. K.VasilevC.HumphrisA. D. L.: ‘Real time observation of crystallization in polyethylene oxide with video rate atomic force microscopy’, Polymer (Guildf), 2005, 46, (23), 10226–10236. doi: 10.1016/j.polymer.2005.08.042
124.
WelchP.MuthukumarM.: ‘Molecular mechanisms of polymer crystallization from solution’, Phys. Rev. Lett., 2001, 87, (21), 218302–218304. doi: 10.1103/PhysRevLett.87.218302
125.
DoyeJ. P. K.FrenkelD.: ‘Crystallization of a polymer on a surface’, J. Chem. Phys., 1998, 109, (22), 10033–10041. doi: 10.1063/1.477672
126.
SommerJ.-U.ReiterG.: ‘Polymer crystallization in quasi-two dimensions. II. Kinetic models and computer simulations’, J. Chem. Phys., 2000, 112, (9), 4384–4394. doi: 10.1063/1.481004
127.
HaysG. F., ‘Now is the Time,’ 2015.
128.
SongG.-L.: ‘The grand challenges in electrochemical corrosion research’, Front. Mater., 2014, 1, (2), 1–3.
129.
ZhaoB.SongY.WangS.DaiB.ZhangL.DongY.LüJ.HuJ.: ‘Mechanical mapping of nanobubbles by PeakForce atomic force microscopy’, Soft Matter, 2013, 9, (37), 8837–8843. doi: 10.1039/c3sm50942g
130.
LaferrereA.BurrowsR.ClarkR.GloverC.WilliamsG.PaytonO.PiccoL.: ‘In situ imaging of corrosion processes in nuclear fuel cladding’ in ‘Eurocorr’, 2015 (ed. European federation of corrosion, 2015. Available at http://www.eurocorr.org/
131.
Erazmus-VignalP.VignalV.SaedlouS.KrajcarzF.: ‘Corrosion behaviour of sites containing (Cr, Fe)2N particles in thermally aged duplex stainless steel studied using capillary techniques, atomic force microscopy and potentiostatic pulse testing method’, Corros. Sci., 2015, 99, 194–204. doi: 10.1016/j.corsci.2015.07.005
132.
GuanL.ZhangB.YongX. P.WangJ. Q.HanE.-H.KeW.: ‘Effects of cyclic stress on the metastable pitting characteristic for 304 stainless steel under potentiostatic polarization’, Corros. Sci., 2015, 93, 80–89. doi: 10.1016/j.corsci.2015.01.009
133.
BirbilisN.MeyerK.MuddleB. C.LynchS. P.: ‘In situ measurement of corrosion on the nanoscale’, Corros. Sci., 2009, 51, (8), 1569–1572. doi: 10.1016/j.corsci.2009.05.009
134.
CarberryD. M.PiccoL.DuntonP. G.MilesM. J.: ‘Mapping real-time images of high-speed AFM using multitouch control’, Nanotechnology, 2009, 20, (43), 434018. doi: 10.1088/0957-4484/20/43/434018
135.
LiX.CaiW.AnJ.KimS.NahJ.YangD.PinerR.VelamakanniA.JungI.TutucE.BanerjeeS. K.ColomboL.RuoffR. S.: ‘Large-area synthesis of high-quality and uniform graphene films on copper foils’, Science, 2009, 324, (5932), 1312–1314. doi: 10.1126/science.1171245
136.
MalloyM.ThielB.BundayB. D.WurmS.MukhtarM.QuoiK.KemenT.ZeidlerD.EberleA. L.GarbowskiT.DellemannG.PetersJ. H.: ‘Massively parallel E-beam inspection: enabling next-generation patterned defect inspection for wafer and mask manufacturing’ in ‘SPIE Advanced Lithography’, (ed. ResnickD. J.BencherC.), 942319, 2015, San-Jose, CA, International Society for Optics and Photonics. doi:10.1117/12.2175535
137.
BaenaJ. C.PengZ.: ‘3D quantitative characterization of degraded surfaces of human knee cartilages affected by osteoarthritis’, Wear, 2014, 319, (1–2), 1–11. doi: 10.1016/j.wear.2014.07.004
138.
RamanA.: ‘Recent advances in atomic force microscopy for nanobiological and nanocomposite applications’, 2010.
KubotaY.: ‘New developments in electron microscopy for serial image acquisition of neuronal profiles’, Microscopy, 2015, 64, (1), 27–36. doi: 10.1093/jmicro/dfu111
141.
EberleA. L.MikulaS.SchalekR.LichtmanJ.TateM. L. K.ZeidlerD.: ‘High-resolution, high-throughput imaging with a multibeam scanning electron microscope’, J. Microsc., 2015, 259, (2), 114–120. doi: 10.1111/jmi.12224
142.
DanceA.: ‘Connectomes make the map’, Nature, 2015, 526, (7571), 147–149. doi: 10.1038/526147a
SomnathS.KimH. J.HuH.KingW. P.: ‘Parallel nanoimaging and nanolithography using a heated microcantilever array’, Nanotechnology, 2014, 25, (1), 014001–014012. doi: 10.1088/0957-4484/25/1/014001
149.
VorburgerT. V.DagataJ. A.WilkeningG.LizukaK.ThwaiteE. G.LonardoP.: ‘Industrial uses of STM and AFM**contribution of the national institute of standards and technology. Not subject to copyright except for illustrations taken from other sources’, CIRP Ann. – Manuf. Technol., 1997, 46, (2), 597–620. doi: 10.1016/S0007-8506(07)60881-6
150.
BorionettiG.BazzaliA.OrizioR.: ‘Atomic force microscopy: a powerful tool for surface defect and morphology inspection in semiconductor industry’, Eur. Phys. J. Appl. Phys., 2004, 27, (1–3), 101–106. doi: 10.1051/epjap:2004129
151.
HubnerU.MorgenrothW.MeyerH. G.SulzbachT.BrendelB.MirandeW.: ‘Downwards to metrology in nanoscale: determination of the AFM tip shape with well-known sharp-edged calibration structures’, Appl. Phys. A: Mater. Sci. Process., 2003, 76, (6), 913–917. doi: 10.1007/s00339-002-1975-6
MarianiT.FredianiC.AscoliC.: ‘A three-dimensional scanner for probe microscopy on the millimetre scale’, Appl. Phys. A Mater. Sci. Process., 1998, 66, (7), S861–S866. doi: 10.1007/s003390051257
DaiG.ZhuF.FlueggeJ.: ‘High-speed metrological large range AFM’, Meas. Sci. Technol., 2015, 26, (9), 095402–095410. doi: 10.1088/0957-0233/26/9/095402
159.
DaiG.PohlenzF.DanzebrinkH.-U.XuM.HascheK.WilkeningG.: ‘Metrological large range scanning probe microscope’, Rev. Sci. Instrum., 2004, 75, (4), 962–969. doi: 10.1063/1.1651638
160.
BoydR. D.CuenatA.: ‘New analysis procedure for fast and reliable size measurement of nanoparticles from atomic force microscopy images’, J. Nanopart. Res., 2011, 13, (1), 105–113. doi: 10.1007/s11051-010-0007-2
161.
KlapetekP.ValtrM.NečasD.SalykO.DzikP.: ‘Atomic force microscopy analysis of nanoparticles in non-ideal conditions’, Nanoscale Res. Lett., 2011, 6, (1), 514–519. doi: 10.1186/1556-276X-6-514
162.
KeC.JiangY.MieczkowskiP. A.MuramotoG. G.ChuteJ. P.MarszalekP. E.: ‘Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy’, Small, 2008, 4, (2), 288–294. doi: 10.1002/smll.200700527
163.
CharboisV.LebretonJ.SavoyeM.LabonneE.LabourierA.DumontB.LenoxC.von Den HoffM.: ‘Defect reduction for 20 nm high-k metal gate technology’ in ‘2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)’, 14–18; 2015, IEEE. doi:10.1109/ASMC.2015.7164443
164.
ZhaoS.YangQ.: ‘A stitching method for AFM based large scale scanning with high resolution’, World Congress, 2014, 19, (1), 2697–2702.
165.
MarinelloF.BarianiP.De ChiffreL.HansenH. N.: ‘Development and analysis of a software tool for stitching three-dimensional surface topography data sets’, Meas. Sci. Technol., 2007, 18, (5), 1404–1412. doi: 10.1088/0957-0233/18/5/028
166.
RankovV.LockeR. J.EdensR. J.VojnovicB.: ‘An algorithm for image stitching and blending’, Proc. SPIE, 2005, 5701, (March), 190–199. doi: 10.1117/12.590536
CullenP.CoxK.Bin SubhanM.PiccoL. M.PaytonO. D.BuckleyD.HodgeS.SkipperN.TileliV.HowardC.: ‘Ionic Solutions of 2-dimensional materials’, Submitted to Science, 2016.
170.
Nemes-InczeP.OsváthZ.KamarásK.BiróL. P.: ‘Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy’, Carbon N. Y., 2008, 46, (11), 1435–1442. doi: 10.1016/j.carbon.2008.06.022
171.
JiaX.Campos-DelgadoJ.TerronesM.MeunierV.DresselhausM. S.: ‘Graphene edges: a review of their fabrication and characterization’, Nanoscale, 2011, 3, (1), 86–95. doi: 10.1039/C0NR00600A
172.
BoneschanscherM. P.van der LitJ.SunZ.SwartI.LiljerothP.VanmaekelberghD.: ‘Quantitative atomic resolution force imaging on epitaxial graphene with reactive and nonreactive AFM probes’, ACS Nano, 2012, 6, (11), 10216–10221. doi: 10.1021/nn3040155
173.
KorpelainenV.SeppäJ.LassilaA.: ‘Design and characterization of MIKES metrological atomic force microscope’, Precis. Eng., 2010, 34, (4), 735–744. doi: 10.1016/j.precisioneng.2010.04.002
RoaJ. J.OncinsG.DíazJ.CapdevilaX. G.SanzF.SegarraM.: ‘Study of the friction, adhesion and mechanical properties of single crystals, ceramics and ceramic coatings by AFM’, J. Eur. Ceram. Soc., 2011, 31, (4), 429–449. doi: 10.1016/j.jeurceramsoc.2010.10.023
176.
van der WerfK.PutmanC.de GroothB.GreveJ.: ‘Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy’, Appl. Phys. Lett., 1994, 65, (9), 1195–1197. doi: 10.1063/1.112106
177.
Dupont-GillainC. C.JacquemartI.: ‘Patterned collagen layers on polystyrene: direct probing using AFM in the adhesion mapping mode’, Surf. Sci., 2003, 539, (1–3), 145–154. doi: 10.1016/S0039-6028(03)00779-9
178.
YablonD. G.GannepalliA.ProkschR.KillgoreJ.HurleyD. C.GrabowskiJ.TsouA. H.: ‘Quantitative viscoelastic mapping of polyolefin blends with contact resonance atomic force microscopy’, Macromolecules, 2012, 45, (10), 4363–4370. doi: 10.1021/ma2028038
179.
KumarA.RabeU.ArnoldW.: ‘Mapping of elastic stiffness in an α+β titanium alloy using atomic force acoustic microscopy’, Jpn. J. Appl. Phys., 2008, 47, (7), 6077–6080. doi: 10.1143/JJAP.47.6077
180.
StanG.KingS. W.CookR. F.: ‘Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy’, Nanotechnology, 2012, 23, (21), 215703–215709. doi: 10.1088/0957-4484/23/21/215703
181.
TurnerJ. A.WiehnJ. S.: ‘Sensitivity of flexural and torsional vibration modes of atomic force microscope cantilevers to surface stiffness variations’, Nanotechnology, 2001, 12, (3), 322–330. doi: 10.1088/0957-4484/12/3/321
182.
GannepalliA.YablonD. G.TsouA. H.ProkschR.: ‘Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM’, Nanotechnology, 2011, 22, (35), 355705. doi: 10.1088/0957-4484/22/35/355705
183.
XuX.MelcherJ.RamanA.: ‘Accurate force spectroscopy in tapping mode atomic force microscopy in liquids’, Phys. Rev. B, 2010, 81, (3), 1–7. doi: 10.1103/PhysRevB.81.035407
184.
XuX.MelcherJ.BasakS.ReifenbergerR.RamanA.: ‘Compositional contrast of biological materials in liquids using the momentary excitation of higher eigenmodes in dynamic atomic force microscopy’, Phys. Rev. Lett., 2009, 102, (6), 060801–060804. doi: 10.1103/PhysRevLett.102.060801
185.
KocunM.LabudaA.GannepalliA.ProkschR.: ‘Contact resonance atomic force microscopy imaging in air and water using photothermal excitation’, Rev. Sci. Instrum., 2015, 86, (8), 083706. doi: 10.1063/1.4928105
186.
AvilaA.BhushanB.: ‘Electrical measurement techniques in atomic force microscopy’, Crit. Rev. Solid State Mater. Sci., 2010, 35, (1), 38–51. doi: 10.1080/10408430903362230
187.
OliverR. A.: ‘Advances in AFM for the electrical characterization of semiconductors’, Reports Prog. Phys., 2008, 71, (7), 076501–076537. doi: 10.1088/0034-4885/71/7/076501
188.
EdingerK.GotszalkT.RangelowI. W.: ‘Novel high resolution scanning thermal probe’, J. Vac. Sci. Technol. B Microelectron. Nanom. Struct., 2001, 19, (6), 2856–2860. doi: 10.1116/1.1420580
189.
PaytonO. D.PiccoL.ScottT.RamanA.SaderJ. E.KillgoreJ.HurleyD. C.: ‘Development of a high-speed contact resonance force microscope’, Submitted to IOP Nanotechnology, 2016.
190.
WarrenA.Martinez-UbedaA.PaytonO.PiccoL.ScottT.: ‘Preparation of stainless steels surfaces for scanning probe microscopy techniques’, Micros. Today, 2016, 24. doi:10.1017/S1551929516000341
QianD.DickeyE. C.AndrewsR.RantellT.: ‘Load transfer and deformation mechanisms in carbon nanotube-polystyrene composites’, Appl. Phys. Lett., 2000, 76, (20), 2868–2870. doi: 10.1063/1.126500
194.
GuptaR. K.BirbilisN.: ‘The influence of nanocrystalline structure and processing route on corrosion of stainless steel: a review’, Corros. Sci., 2015, 92, 1–15. doi: 10.1016/j.corsci.2014.11.041
195.
FunakawaY.ShiozakiT.TomitaK.YamamotoT.MaedaE.: ‘Development of high strength hot-rolled sheet steel consisting of ferrite and nanometer-sized carbides’, ISIJ Int., 2004, 44, (11), 1945–1951. doi: 10.2355/isijinternational.44.1945
196.
ParkJ. W.LeeH. C.LeeS.: ‘Composition, microstructure, hardness, and wear properties of high-speed steel rolls’, Metall. Mater. Trans. A, 1999, 30, (2), 399–409. doi: 10.1007/s11661-999-0329-9
197.
BadischE.MittererC.: ‘Abrasive wear of high speed steels: Influence of abrasive particles and primary carbides on wear resistance’, Tribol. Int., 2003, 36, (10), 765–770. doi: 10.1016/S0301-679X(03)00058-6
198.
PetchN. J.: ‘The influence of grain boundary carbide and grain size on the cleavage strength and impact transition temperature of steel’, Acta Metall., 1986, 34, (7), 1387–1393. doi: 10.1016/0001-6160(86)90026-X
199.
EnnosA. E.: ‘The origin of specimen contamination in the electron microscope’, Br. J. Appl. Phys., 1953, 4, (4), 101–106. doi: 10.1088/0508-3443/4/4/302
TchuindjangJ. T.Lecomte-BeckersJ.: ‘Use of microscopy for identification of complex MC, M2C, M7C3, M6C and M23C6 carbides in high-speed steels’, GIT Imaging and Microscopy, 2005, 1, 2–3.
202.
HayakawaM.MatsuokaS.TsuzakiK.: ‘Microstructural analyses of grain boundary carbides of tempered martensite in medium-carbon steel by atomic force microscopy’, Mater. Trans., 2002, 43, (7), 1758–1766. doi: 10.2320/matertrans.43.1758
203.
CohenS. R.Kalfon-CohenE.: ‘Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review’, Beilstein J. Nanotechnol., 2013, 4, 815–833. doi: 10.3762/bjnano.4.93
204.
PaytonO. D.PiccoL.Martinez-UbedaA.WarrenA.ScottT. B.: ‘The continuing development of high-speed atomic force microscopy for use with EDF steel samples’, Bristol 2014.
205.
MatsagarV., Ed., ‘Advances in structural engineering’, 2015, Springer India. doi:10.1007/978-81-322-2190-6
206.
HaaseC.KühbachM.Barrales-MoraL. A.WongS. L.RotersF.MolodovD. A.GottsteinG.: ‘Recrystallization behavior of a high-manganese steel: experiments and simulations’, Acta Mater., 2015, 100, 155–168. doi: 10.1016/j.actamat.2015.08.057
207.
SvyetlichnyyD. S.MuszkaK.MajtaJ.: ‘Three-dimensional frontal cellular automata modeling of the grain refinement during severe plastic deformation of microalloyed steel’, Comput. Mater. Sci., 2015, 102, 159–166. doi: 10.1016/j.commatsci.2015.02.034
208.
HuttererS.MayrS.ZaunerG.SilyeR.SchilcherK.: ‘Data mining supported analysis of medical atomic force microscopy images’ in ‘2013 IEEE Symposium on Computational Intelligence in Healthcare and e-health (CICARE)’, 99–104; 2013, IEEE. doi:10.1109/CICARE.2013.6583076
StanG.CookR. F.: ‘Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy’, Nanotechnology, 2008, 19, (23), 235701–235710. doi: 10.1088/0957-4484/19/23/235701
212.
YuyaP. A.HurleyD. C.TurnerJ. A.: ‘Contact-resonance atomic force microscopy for viscoelasticity’, J. Appl. Phys., 2008, 104, (7), 074916–074917. doi: 10.1063/1.2996259
213.
LozanoJ. R.KiracofeD.MelcherJ.GarciaR.RamanA.: ‘Calibration of higher eigenmode spring constants of atomic force microscope cantilevers’, Nanotechnology, 2010, 21, 465502–465507. doi: 10.1088/0957-4484/21/46/465502
GökenM.KempfM.: ‘Microstructural properties of superalloys investigated by nanoindentations in an atomic force microscope’, Acta Mater., 1999, 47, (3), 1043–1052. doi: 10.1016/S1359-6454(98)00377-2
216.
OliverW. C.PharrG. M.: ‘Nanoindentation in materials research: past, present, and future the original nanoindenter’, MRS Bulletin, 2010, 35, (11), 897–907.
217.
LiX.LiZ.TaoX. F.RenL. L.GaoS. T.XuG. F.: ‘Distribution of residual strain around nanoindentations in silicon’, Mater. Lett., 2014, 132, (September), 285–289. doi: 10.1016/j.matlet.2014.06.004
218.
AllenD.: ‘Analysis of silicon wafer damage due to nanoindentation by microraman spectroscopy and white beam synchrotron X-ray toporaphy’, 2014. Dublin City University. School of Electronic Engineering.
219.
BraunsmannC.SeifertJ.RheinlaenderJ.SchäfferT. E.: ‘High-speed force mapping on living cells with a small cantilever atomic force microscope’, Rev. Sci. Instrum., 2014, 85, (7), 073703–073708. doi: 10.1063/1.4885464
220.
KolosovO.GruvermanA.HatanoJ.TakahashiK.TokumotoH.: ‘Nanoscale visualization and control of ferroelectric domains by atomic force microscopy’, Phys. Rev. Lett., 1995, 74, (21), 4309–4312. doi: 10.1103/PhysRevLett.74.4309
221.
ButtH. J.CappellaB.KapplM.: ‘Force measurements with the atomic force microscope: technique, interpretation and applications’, Surf. Sci. Rep., 2005, 59, (1–6), 1–152. doi: 10.1016/j.surfrep.2005.08.003
222.
GruvermanA.AucielloO.TokumotoH.: ‘Scanning force microscopy for the study of domain structure in ferroelectric thin films’, J. Vac. Sci. Technol. B Microelectron. Nanomet. Struct., 1996, 14, (2), 602–605. doi: 10.1116/1.589143
223.
NathR.ChuY.-H.PolomoffN. A.RameshR.HueyB. D.: ‘High speed piezoresponse force microscopy: @1 frame per second nanoscale imaging’, Appl. Phys. Lett., 2008, 93, (7), 072905. doi: 10.1063/1.2969045
224.
Álvarez-AsencioR.PanJ.ThormannE.RutlandM. W.: ‘Tribological properties mapping: local variation in friction coefficient and adhesion’, Tribol. Lett., 2013, 50, (3), 387–395. doi: 10.1007/s11249-013-0136-8
225.
SaderJ. E.SanelliJ. A.AdamsonB. D.MontyJ. P.WeiX.CrawfordS. A.FriendJ. R.MarusicI.MulvaneyP.BieskeE. J.: ‘Spring constant calibration of atomic force microscope cantilevers of arbitrary shape’, Rev. Sci. Instrum., 2012, 83, (10), 103705–103716. doi: 10.1063/1.4757398
226.
SaderJ. E.LarsonI.MulvaneyP.WhiteL. R.: ‘Method for the calibration of atomic force microscope cantilevers’, Rev. Sci. Instrum.,1995, 66, (July), 3789–3798.
227.
PaytonO. D.PiccoL.MilesM. J.HomerM. E.ChampneysA. R.: ‘Modelling oscillatory flexure modes of an atomic force microscope cantilever in contact mode whilst imaging at high speed’, Nanotechnology, 2012, 23, (26), 265702–265707. doi: 10.1088/0957-4484/23/26/265702
228.
KiracofeD.RamanA.: ‘On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids’, J. Appl. Phys., 2010, 107, (3), 033506–033509. doi: 10.1063/1.3284206
229.
SnowE. S.CampbellP. M.PerkinsF. K.: ‘High speed patterning of a metal silicide using scanned probe lithography’, Appl. Phys. Lett., 1999, 75, (10), 1476–1478. doi: 10.1063/1.124730
230.
TsengA. A.NotargiacomoA.ChenT. P.: ‘Nanofabrication by scanning probe microscope lithography: a review’, J. Vac. Sci. Technol. B: Microelectron. Nanometer. Struct., 2005, 23, (3), 877–894. doi: 10.1116/1.1926293
ObermairC.WagnerA.SchimmelT.: ‘The atomic force microscope as a mechano–electrochemical pen’, Beilstein J. Nanotechnol., 2011, 2, 659–664. doi: 10.3762/bjnano.2.70
LosillaN. S.MartinezJ.BystrenovaE.GrecoP.BiscariniF.GarcíaR.: ‘Patterning pentacene surfaces by local oxidation nanolithography’, Ultramicroscopy, 2010, 110, (6), 729–732. doi: 10.1016/j.ultramic.2010.02.040
237.
GarcíaR.CallejaM.RohrerH.: ‘Patterning of silicon surfaces with noncontact atomic force microscopy: field-induced formation of nanometer-size water bridges’, J. Appl. Phys., 1999, 86, (4), 1898–1903. doi: 10.1063/1.370985
238.
StievenardD.FontaineP.DuboisE.: ‘Nanooxidation using a scanning probe microscope: an analytical model based on field induced oxidation’, Appl. Phys. Lett., 1997, 70, (24), 3272–3274. doi: 10.1063/1.118425
239.
TelloM.GarcíaR.: ‘Nano-oxidation of silicon surfaces: comparison of noncontact and contact atomic-force microscopy methods’, Appl. Phys. Lett., 2001, 79, (3), 424–426. doi: 10.1063/1.1385582
240.
DayH. C.AlleeD. R.: ‘Selective area oxidation of silicon with a scanning force microscope’, Appl. Phys. Lett., 1993, 62, (21), 2691–2693. doi: 10.1063/1.109259
241.
VicaryJ. A.MilesM. J.: ‘Pushing the boundaries of local oxidation nanolithography: short timescales and high speeds’, Ultramicroscopy, 2008, 108, (10), 1120–1123. doi: 10.1016/j.ultramic.2008.04.061
242.
ChoiY.-S.WuX.LeeD.-W.: ‘Selective nano-patterning of graphene using a heated atomic force microscope tip’, Rev. Sci. Instrum., 2014, 85, (4), 045002–045009. doi: 10.1063/1.4870588
DagataJ. A.MartinC.KuramochiH.YokoyamaH.: ‘Current, charge, and capacitance during scanning probe oxidation of silicon. I. Maximum charge density and lateral diffusion’, J. Appl. Phys., 2004, 96, (4), 2386–2392.
van OorschotR.Perez GarzaH.DerksR. J. S.StauferU.GhatkesarM.: ‘A microfluidic AFM cantilever based dispensing and aspiration platform’, EPJ Tech. Instrum., 2015, 2, (1), 4. doi: 10.1140/epjti/s40485-014-0012-4
WangZ.TanJ.ZouQ.JiangW.: ‘Control-based high-speed direct mask fabrication for lithography via mechanical plowing’ in ‘2013 American Control Conference’, 5183–5188; 2013, IEEE.
256.
HeydeM.RademannK.CappellaB.GeussM.SturmH.SpangenbergT.NiehusH.: ‘Dynamic plowing nanolithography on polymethylmethacrylate using an atomic force microscope’, Rev. Sci. Instrum., 2001, 72, (1), 136–141. doi: 10.1063/1.1326053
257.
LuX.BaloccoC.YangF.SongA. M.: ‘Highly reproducible nanolithography by dynamic plough of an atomic-force microscope tip and thermal-annealing treatment’, IEEE Trans. Nanotechnol., 2011, 10, (1), 53–58. doi: 10.1109/TNANO.2010.2053045
258.
SongC.LiX.YuB.DongH.QianL.ZhouZ.: ‘Friction-induced nanofabrication method to produce protrusive nanostructures on quartz’, Nanoscale Res. Lett., 2011, 6, (1), 310–319. doi: 10.1186/1556-276X-6-310
NievergeltA. P.AdamsJ. D.OdermattP. D.FantnerG. E.: ‘High-frequency multimodal atomic force microscopy’, Beilstein J. Nanotechnol., 2014, 5, 2459–2467. doi: 10.3762/bjnano.5.255
261.
MüllerD. J.DufrêneY. F.: ‘Atomic force microscopy as a multifunctional molecular toolbox in nanobiotechnology’, Nat. Nanotechnol., 2008, 3, (5), 261–269. doi: 10.1038/nnano.2008.100
262.
SchneegansO.HouzeF.MeyerR.BoyerL.: ‘Study of the local electrical properties of metal surfaces using an AFM with a conducting probe’, Components Packag. Manuf. Technol. A: IEEE Trans., 1998, 21, (1), 76–81. doi: 10.1109/95.679036
263.
AlvarezJ.NgoI.Gueunier-FarretM.-E.KleiderJ.-P.YuL.CabarrocasP. R.PerraudS.RouviereE.CelleC.MouchetC.SimonatoJ.-P.: ‘Conductive-probe atomic force microscopy characterization of silicon nanowire’, Nanoscale Res., 2011, 6, (1), 110–119. doi: 10.1186/1556-276X-6-110
264.
JesseS.KalininS. V.: ‘Band excitation in scanning probe microscopy: sines of change’, J. Phys. D. Appl. Phys., 2011, 44, (46), 464006–464016. doi: 10.1088/0022-3727/44/46/464006
265.
XuS.ArnsdorfM. F.: ‘Electrostatic force microscope for probing surface charges in aqueous solutions’, Proc. Natl. Acad. Sci. U. S. A., 1995, 92, (22), 10384–10388. doi: 10.1073/pnas.92.22.10384
266.
Van Der PolE.HoekstraA. G.SturkA.OttoC.Van LeeuwenT. G.NieuwlandR.: ‘Optical and non-optical methods for detection and characterization of microparticles and exosomes’, J. Thromb. Haemost., 2010, 8, (12), 2596–2607. doi: 10.1111/j.1538-7836.2010.04074.x
