A fault monitor for automated manufacturing systems using a hybrid Petri nets formalism

Abstract

Fault monitoring is an essential requirement for safety and reliability of industrial systems. The paper presents a novel event-based online monitoring technique for automated manufacturing systems, ensuring timely and accurate detection of system failures. The monitor model is based on first-order hybrid Petri nets, ie, Petri nets that make use of first-order fluid approximation. The proposed fault analysis technique relies on a modular framework, so that elementary monitors can be connected with other monitors to check more complex systems while avoiding the state—space explosion problem. In addition, the presented monitor detects system faults as soon as possible, before the maximum execution time assigned to each task. Several examples and an application to an automated manufacturing system proposed in the related literature enlighten the simplicity and modularity of the technique.

Keywords

automated manufacturing systems discrete event systems fault monitoring fault detection hybrid Petri nets.

Get full access to this article

View all access options for this article.

References

Allahham, A. and Alla, H. 2007: Monitoring of a class of timed discrete events systems . IEEE International Conference on Robotics and Automation, Rome, 1003-1008.

Balduzzi, F. , Giua, A. and Menga, G. 2000: Modelling and control with first order hybrid Petri nets . IEEE Transactions on Robotics and Automation 16, 382-99.

Ghazel, M. , Toguèni, A. and Bigang, M. 2005: A monitoring approach for discrete events systems based on a timed Petri net model. 16th IFAC World Congress , Prague.

Giua, A. and Seatzu, C. 2005: Fault detection for discrete event systems using Petri nets with unobservable transitions. 44th IEEE Conference on Decision and Control and European Control Conference, Seville, 6323-28.

Hadjicostis, C.N. and Veghese, G.C. 1999: Monitoring discrete event systems using Petri net embeddings . Lecture Notes in Computer Science 1639, 188-207.

Jiang, S. , Kumar, R. and Garcia, H.E. 2003: Diagnosis of repeated/intermittent failure in discrete event systems. IEEE Transactions on Robotics and Automation 19, 310-23.

Larsson, M. 1998: Diagnosis and analysis of diagnosis properties using discrete event dynamic systems. 37th IEEE Conference on Decision and Control, Tampa, FL, 3775-80.

Lee, W.S. , Grosh, D.L. , Tillman, F.A. and Lie, C.H. 1985: Fault tree analysis, methods, and applications - a review . IEEE Transactions on Reliability 34, 194-203.

Lin, F. 1994: Diagnosability of discrete event systems and its applications . Discrete Event Dynamic Systems 4, 197-212.

10.

Pandalai, D.N. and Holloway, L.E. 2000: Template languages for fault monitoring of timed discrete event processes. IEEE Transactions on Automatic Control 45, 868-82.

11.

Ramirez-Trevino, A. , Ruiz-Beltràn, E. , Rivera-Rangel, I. and Lopez-Mellado, E. 2007: Online fault diagnosis of discrete event systems. A Petri net-based approach. IEEE Transactions on Automation Science and Engineering 4, 31-39.

12.

Sampath, M. , Sengupta, R. , Lafortune, S. , Sinnamohideen, K. and Teneketzis, D. 1995: Diagnosability of discrete event systems. IEEE Transactions on Automatic Control 40, 1555-75.

13.

Sampath, M. , Sengupta, R. , Lafortune, S. , Sinnamohideen, K. and Teneketzis, D. 1996: Failure diagnosis using discrete-event models. IEEE Transactions on Control Systems Technology 4, 105-24.

14.

Sampath, M. , Lafortune, S. and Teneketzis, D. 1998: Active diagnosis of discrete-event systems. IEEE Transactions on Automatic Control 43, 908-29.

15.

Srinivasan, V.S. and Jafari, M.A. 1993: Fault detection/monitoring using time Petri nets. IEEE Transactions on Systems, Man and Cybernetics 23, 1155-62.

16.

Zad, S.H. , Kwong, R.H. and Wonham, W.M. 2003: Fault diagnosis in discrete-event systems: framework and model reduction. IEEE Transactions on Automatic Control 48, 1199-212.

17.

Zhou, M.C. and Venkatesh, K. ( 1999): Modeling, simulation, and control of flexible manufacturing systems: a Petri net approach. World Scientific.