An improved computationally efficient means of determin ing the capacitance matrix from the finite element repre sentation of a capacitance tomography system is shown. This direct method is also applied to the analysis of impedance tomography for systems in which there exists either an insulating boundary or a conducting boundary. The paper discusses aspects of the direct solution method which can influence the solution time and accuracy, and the application of multi-frontal solution techniques, to enhance solution times on scalable parallel computing hardware.
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