Efects of Micuum Ultraviolet Radiation of Irious Wavelength Ranges on Teflon® FEP Film

Abstract

This paper describes testing to investigate the effects of vacuum ultraviolet (VUV) radiation on Teflon fluorinated ethylene propylene (FEP) film, examining differences in mechanical properties degradation for samples of 50.8 jtm thickness exposed to VUV of various lower cut-off wavelengths. Samples were illuminated in a high vacuum facility by deuterium lamps, which provide radiation in the 115-400 nm wavelength range, but with the highest intensity being below 200 nm. Windows of fused silica, crystalline quartz, and magnesium fluoride provided lower cut-off wavelengths of 155, 140 and 115 nm, respectively. Lamp intensity was measured in the 115-200 nm wavelength range throughout the sample exposures. The determined intensities were used to estimate intensity and incident energy of various wavelength ranges, between 115 and 400 nm. Samples were analysed for tensile strength and elongation at failure. The effects of radiation exposures of different wavelength ranges were compared and discussed in terms of the expected depth to which radiation of various wavelengths is deposited into FEP

Keywords

Vaccuum ultraviolet space simulation Teflon®degradation

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