Adhesive force due to van der Waals interactions plays a significant role in contact interactions at small scale. In this work, we propose a novel simulation module for performing adhesive contact analysis using a finite element (FE) software, based on a lumped parameter formulation. The numerical results are validated by comparing with analytical results. The proposed model significantly reduces computational resource requirements compared to direct implementation of body force in FE software. Adhesion-induced instability (jump-to-contact) phenomenon is studied with the help of this computational model. Finally, we demonstrate the applicability of the proposed formulation by studying the effect of adhesion applied to cantilever dynamics on an atomic force microscope.
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