Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints
Restricted accessResearch articleFirst published online October, 2025
Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints
We introduce here a new family of divergence-based estimators in this work for predicting the lifetimes of one-shot devices subjected to cyclic Accelerated Life-Tests (ALTs). This family, which includes the maximum likelihood estimator (MLE) as a special case, offers a robust alternative to traditional inferential procedures. We also present a family of divergence-based model selection criteria. A simulation study and a numerical example illustrate the advantages of these estimators and the robust inferential methods based on them.
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