Abstract
A direct reading emission spectrometer system is described which permits dynamic background correction measurements at each analytical wavelength. The system utilizes a refractor plate mounted on a tuning fork as a rapid means for square-wave shifting the spectral band pass from each analytical wavelength to the adjacent background wavelength position. A laboratory computer controls the system, receives the data, and performs the background subtraction. Evaluation of the system has shown that photon counting statistics are applicable and that reliable background corrections are obtained. Comparisons of this correction approach with others that have been used have further demonstrated its advantages for multielement analysis by emission spectrometry.
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