We report FT-IR-VCD recorded under improved conditions of signal-to-noise ratio, resolution, and spectral range (to 800 cm−1). Detailed descriptions are provided in the areas of artifact suppression, phase correction procedures, and comparison of FT-IR to dispersive VCD measurements. Spectral evidence supports the proposition that VCD absorbance artifacts are a surface effect originating at the optical window-solution interface.
LippE. D.ZimbaC. G., and NafieL. A., Chem. Phys. Lett.90, 1 (1982).
2.
NafieL. A. and VidrineD. W., in Fourier Transform Infrared Spectroscopy, FerraroJ. R. and BasileL. J., Eds. (Academic Press, New York, 1982), Vol. 3, p. 83.
3.
NafieL. A.LippE. D., and ZimbaC. G., in Proceedings of the 1981 International Conference on Fourier Transform Infrared Spectroscopy, SakaiH., Ed. (SPIE, Bellingham, 1981), Vol. 289, p. 457.
4.
NafieL. A. and DiemM., Appl. Spectrosc.33, 130 (1979).
5.
NafieL. A.DiemM., and VidrineD. W., J. Am. Chem. Soc.101, 496 (1979).
6.
ChengJ. C.NafieL. A., and StephensP. J., J. Opt. Soc. Am.65, 1031 (1975).
7.
NafieL. A.KeiderlingT. A., and StephensP. J., J. Am. Chem. Soc.98, 2715 (1976).
8.
LippE. D.ZimbaC. G.NafieL. A., and VidrineD. W., Appl. Spectrosc.36, 496 (1982).
9.
ChabayI.HsuE. C., and HolzwarthG., Chem. Phys. Lett.15, 211 (1972); ChabayI. and HolzwarthG., Appl. Opt.14, 454 (1975).
10.
SinghR. D. and KeiderlingT. A., J. Chem. Phys.74, 5347 (1981); SuC. N.HeintzV. J., and KeiderlingT. A., Chem. Phys. Lett.73, 157 (1980).
11.
SuC. N., Ph.D. Thesis, University of Illinois, Chicago (1982).
12.
SinghR. D. and KeiderlingT. A., J. Am. Chem. Soc.103, 2387 (1981).
