Electromagnetic fluid shows a unique behavior as elongation and sharpening in electrostatic field. Especially the electromagnetic fluid in this research can be largely deformed in microscale without breakup or collapsing thanks to its very high viscosity. The technique can be applied to microscale structures or MEMS devices. However experimental approach to control the deformation is insufficient because it is very difficult to measure electrostatic stress and surface tension acting on electrostatic fluid during deformation. This research reveals its mechanism quantitatively by calculating the deformation of electromagnetic fluid with a proposed combined method of FEM and MPS (Moving Particle Semi-implicit).
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