Abstract
In computed tomography (CT) systems, it is desirable to know the X-ray energy spectra for various applications, including medical CT imaging, and diagnostic field and heavy ion therapy. However, because of the restricted space, the only practical solution is to use Compton spectroscopy, where the incident spectrum is inferred from the scattered spectrum. The geometry of the scatterer and its position within the CT can affect the spectrum of the secondary beam, making it difficult to determine the primary spectrum during operation of the CT system. A modified Compton spectrometer is described that allows measurement of the X-ray energy spectra during operation, and most importantly, in rotation mode. The geometry of the scatterer was optimized to reduce the energy broadening of the secondary beam. The performance of the system was evaluated by comparing the reconstructed exposure to that measured directly using an ion chamber.